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Atomic force microscopy
Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a very high-resolution type of Scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. ==Overview==
Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a very high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
抄文引用元・出典: フリー百科事典『 ウィキペディア(Wikipedia)』 ■ウィキペディアで「Atomic force microscopy」の詳細全文を読む
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